Applications & Research Domains

Ultrasonic atomisation produces droplets around 20 µm in diameter with very low kinetic energy, preventing dewetting on hydrophobic perovskite surfaces. The XY motion system allows precise layer-by-layer deposition on any substrate geometry, and the low flow rates minimise waste of expensive perovskite precursor solutions.

Kelvin probe force microscopy (KPFM) maps the local surface potential and work function across a solar cell cross-section at nanoscale resolution. This reveals grain boundary potential barriers, charge accumulation at interfaces, and local efficiency losses — information that optical microscopy cannot provide.

Yes. Raman and photoluminescence (PL) spectroscopy are complementary tools for perovskite characterisation. Raman identifies phase purity and structural defects, while PL maps carrier lifetime and recombination behaviour. Combined Raman/PL systems such as the Protrustech MRID can acquire both spectra from the identical spot in a single measurement.

Ultrasonic spray coating deposits polymer-drug solutions as a uniform thin film on stent wire geometries. The low-momentum droplets conform to the complex 3D surface without pooling at intersections — a critical requirement for uniform drug release kinetics. Coating thickness can be precisely controlled by adjusting flow rate, nozzle speed, and number of passes.

Depending on polymer concentration, solvent, applied voltage, and collector distance, electrospinning produces fibers from approximately 50 nm to several micrometres in diameter. This range overlaps with native extracellular matrix fiber dimensions (50–500 nm), making electrospun scaffolds highly suitable for cell culture and tissue engineering applications.

In graphene, the ratio of the 2D peak intensity to the G peak intensity is strongly dependent on layer number. Monolayer graphene shows a 2D/G ratio above 2 with a sharp, symmetric 2D peak. Bilayer graphene produces a broader, asymmetric 2D peak, and few-layer graphene progressively approaches the bulk graphite spectrum. This analysis is non-destructive and takes seconds.

KPFM maps the contact potential difference between the AFM tip and the sample surface, which directly reflects local work function and surface potential variations. On 2D materials, this reveals charge transfer at grain boundaries, doping gradients, layer-dependent work function changes, and electrostatic disorder in heterostructures.

Yes, for many quality control and R&D applications. The COXEM EM-40PE with its 50×50mm stage is designed for membrane filter and large sample analysis. For full-wafer inspection requiring 100mm stage travel and sub-3nm resolution, the CX-300 full-size SEM is the appropriate choice. Both support optional EDS for elemental analysis.

Raman spectroscopy non-destructively measures residual stress in silicon and III-V semiconductor films by tracking peak shifts, identifies crystal phase and polymorph, characterises doping levels in silicon, and detects surface contamination and thin film composition. It is a standard complementary technique to SEM-EDS in semiconductor process control.

HEPA filters must capture ≥99.97% of particles ≥0.3 µm. Electrospun nanofiber layers with fiber diameters of 100–500 nm, when deposited on a conventional melt-blown substrate, create a composite membrane capable of meeting HEPA performance requirements with lower pressure drop than purely melt-blown media.

SEM provides direct visualisation of fiber morphology, diameter distribution, pore size, and surface structure. The EM-40PE is specifically designed to image standard 47mm membrane filters directly without cutting or preparation. EDS can identify contamination or coatings on the fiber surface, and LV mode allows imaging of non-conductive polymer membranes without sputter coating.

Electron backscatter diffraction (EBSD) is an SEM-based technique that maps crystal orientation grain by grain across a sample surface. It reveals texture, grain boundary character, recrystallisation, phase identification, and residual strain — information critical in metallurgy, battery cathode research, ceramics, and semiconductor crystal quality assessment.

MFM uses a magnetically coated AFM tip that interacts with the stray magnetic field of a sample. By lifting the tip to a set height after topography acquisition, MFM maps the magnetic domain structure with nanometre resolution. It is used for characterising permanent magnets, hard drive media, magnetic nanoparticles, and spintronic devices.

Yes. Ultrasonic spray coating is inherently low-temperature — the substrate temperature is controlled independently and can be set to room temperature or below 100°C, well within the thermal tolerance of PET and PEN. The vacuum plate accessory (IdaVac) holds flexible substrates flat during deposition, ensuring uniform coating across the full substrate area.

Conductive AFM (C-AFM) simultaneously maps surface topography and local electrical current at nanoscale resolution. In flexible electronics, it identifies current-carrying percolation pathways in AgNW networks, detects insulating gaps in printed conductors, and characterises local conductivity in PEDOT:PSS films — all at the scale relevant to device performance.