Categories: Scanning Electron Microscopes

CX-300 (Full-size SEM)

Full-Size SEM — CX-300 The CX-300 is a full-sized Scanning Electron Microscope designed for large-area analysis. Featuring the intuitive NanoStation5 GUI, it offers easy and efficient operation.

Full-Size SEM — CX-300

The CX-300 is a full-sized Scanning Electron Microscope designed for large-area analysis. Featuring the intuitive NanoStation5 GUI, it offers easy and efficient operation. With a maximum magnification of 500,000×, sub-3nm resolution, and an expanded chamber that accommodates larger samples, the CX-300 sets a new standard for powerful yet accessible microscopy across research and quality control applications.

Key Applications

  • Large-area sample analysis and inspection
  • Advanced materials research and characterisation
  • Failure analysis and defect detection
  • Semiconductor and electronics inspection
  • Pharmaceutical and life science research
  • Industrial quality control

Essential Features

Sub-3nm Resolution

Spatial resolution below 3 nm with magnification up to 500,000× for fine structural detail.

NanoStation5 GUI

Intuitive, user-friendly interface for fast, efficient operation — minimal training required.

Expanded Chamber

Accommodates larger samples with a 100 × 100 mm stage and full 360° rotation.

5-Axis Motorized Stage

X/Y/Z translation plus 360° rotation and -20° to 90° tilt for full sample orientation control.

Multiple Vacuum Modes

HV, LV (20 Pa), and VP (10/20/30 Pa) modes for a wide range of sample types.

High-Capacity Vacuum System

300 L turbo pump combined with 100 L rotary pump for stable, fast pump-down performance.

Software Features

Panorama v2
Auto Focus
1-Second Auto Brightness & Contrast
Auto Start
Signal Mixing
Triple Display & Save
Line Profile
Image Filtering
Annotation Tool
ChamberCam

Why Choose the CX-300?

  • Full-Size Performance: Sub-3nm resolution and 500,000× magnification for the most demanding analytical work
  • Large Sample Capability: 100 × 100 mm stage with full rotation and wide tilt range
  • Intuitive Operation: NanoStation5 GUI minimises training time and maximises productivity
  • Flexible Vacuum Modes: HV, LV, and VP for conductive and non-conductive samples alike
  • Broad Expansion Options: EDS (Oxford, Bruker), EBSD, STEM, Coolstage, NanofiberScanner, and more

Available Through Utrecht Instruments

Contact us for a demonstration, technical consultation, or competitive pricing on the CX-300.