EM-30N (Tabletop SEM)
Tabletop SEM — EM-30N
The EM-30N is COXEM’s most popular tungsten filament-based Tabletop SEM. Featuring 5th-generation DSP (Digital Signal Processing) technology, it delivers crystal-clear, low-noise images even at high magnification. Panorama Mode provides wide-area scanning capability, while LV (Low Vacuum) mode enables pristine imaging of non-conductive samples without coating. The EM-30N is also the world’s first tabletop SEM to seamlessly integrate with compact EBSD, further elevating its versatility and performance.
Key Applications
- Materials science and quality control
- Failure analysis and defect inspection
- Non-conductive sample imaging without coating (LV mode)
- Crystallographic analysis with integrated EBSD
- Pharmaceutical and medical device research
- Electronics and semiconductor inspection
Essential Features
5th-Gen DSP Technology
Crystal-clear, low-noise imaging at all magnification levels thanks to advanced digital signal processing.
Sub-5nm Resolution
Spatial resolution below 5 nm with magnification from 15× up to 150,000×.
Panorama Mode
Wide-area scanning capability for comprehensive sample overview at high resolution.
Low Vacuum (LV) Mode
Image non-conductive samples without sputter coating — no sample preparation required.
World’s First Tabletop SEM with Compact EBSD
Seamless integration with compact EBSD for crystallographic analysis in a desktop footprint.
Compact Tabletop Design
400 × 630 × 600 mm footprint and 85 kg — fits comfortably in any standard laboratory.
Software Features
Auto Focus
Auto Brightness & Contrast
Auto Start
Signal Mixing
Dual Display & Save
Line Profile
Image Filtering
Annotation Tool
ChamberCam
Why Choose the EM-30N?
- Most Popular Model: Proven performance across thousands of research and industrial installations worldwide
- No Coating Required: LV mode enables direct imaging of non-conductive samples
- World-First EBSD Integration: Crystallographic analysis in a compact tabletop platform
- Expandable Platform: Optional EDS, EBSD, STEM, Coolstage, NanofiberScanner, and more
- Tilting Stage: 0–45° tilt for flexible sample orientation and analysis
Available Through Utrecht Instruments
Contact us for a demonstration, technical consultation, or competitive pricing on the EM-30N.